Effects of submicrometer particulate silica addenda on the adhesion of micrometer-size particles to a polyester-composite substrate
Source abstract
Abstract
The force needed to detach five sets of different size particles, having number-averaged diameters between 3.6 and 8.5 µm, from a composite substrate was measured using an ultracentrifuge. In addition to size variations, the asperity concentration for each size particle was adjusted by varying the silica concentration, adjusted so that the surface area concentration at each level was kept constant for the five sizes of particles. Due to the changing silica concentration and particle size, the charge per particle also varied. It was found that the detachment force appeared to be virtually independent of charge, with any correlation actually appearing slightly negative, if anything. However, the detachment force increased monotonically with increasing particle diameter and decreased monotonically with increasing silica concentration. Moreover, upon normalizing the detachment force to the particle diameter and the silica concentration to the surface area concentration of silica, it was found that the detachment force clustered into groups in which the force needed to separate the particle from the substrate depended only on the silica concentration. These results suggest that van der Waals interaction, rather than electrostatic forces, are the dominant mechanism controlling toner adhesion in this instance.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Adhesion, Friction, and Surface Interactions · Force Microscopy Techniques and Applications · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (32)
Show source-provided references
1. DePalma V. M. · Photographic Sci. Engin. · 1982 · 26 · 198
2. 10.1080/0021846980801111310.1080/00218469808011113 ↗
3. Goel N. S. · Polymer Sci. Technol. · 1975 · 9 · 763
4. 10.1016/0001-8686(67)80004-610.1016/0001-8686(67)80004-6 ↗
5. Hays D. A. · Photographic Sci. Engin. · 1978 · 22 · 232
6. Hays , D. A. and Wayman , W. H. 1983.Inst. Phys. Conf. Ser. No. 66: Electrostatics237–242.
7. Hays D. A. · J. Imag. Sci. · 1989 · 33 · 160
8. Eklund , E. A. Wayman , W. H. Brillson , L. J. and Hays , D. A. 1994.IS&T's Tenth International Congress on Advances in Non-Impact Printing Technologies, 142–146. Springfield, VA: IS&T.
9. Mastrangelo C. · J. Photographic Sci. Engin. · 1982 · 26 · 194
10. Nebenzahl L. · Photographic Sci. Engin. · 1980 · 24 · 293
11. Hays , D. A. 1996.Advances in Particle Adhesion, Edited by: Rimai , D. S. and Sharpe , L. H. 41–48. Amsterdam: Overseas Publishers Association (Gordon and Breach Publishers).
12. 10.1021/la960656z10.1021/la960656z ↗
13. 10.1063/1.165811510.1063/1.1658115 ↗
14. Donald D. K. · Photographic Sci. Engin. · 1970 · 14 · 36
15. 10.1007/978-1-4615-9531-1_1310.1007/978-1-4615-9531-1_13 ↗
16. 10.1007/978-1-4615-9531-1_1010.1007/978-1-4615-9531-1_10 ↗
17. Iimura , H. Kurosu , H. and Yamaguchi , T. Proc. IS&T's NIP15: International Conference on Digital Printing Technologies. pp.535–538. Springfield, VA: IS&T.10.2352/ISSN.2169-4451.1999.15.1.art00039_2 ↗
18. Gady B. · J. Imag. Sci. Technol. · 1999 · 43 · 28910.2352/J.ImagingSci.Technol.1999.43.3.art00017 ↗
19. Rimai D. S. · J. Imag. Sci. Technol. · 2001 · 45 · 17910.2352/J.ImagingSci.Technol.2001.45.2.art00010 ↗
20. Ott , M. L. and Silence , S. M. Proc. of the 18th Annual Meeting of the Adhesion Society. Edited by: Holubka , J. W. pp.243–245. Blacksburg, VA, USA: The Adhesion Society.
21. Rushing A. J. · J. Imag. Sci. Technol. · 2001 · 45 · 18710.2352/J.ImagingSci.Technol.2001.45.2.art00011 ↗
22. Rimai D. S. · J. J. Imag. Sci. Technol. · 2002 · 46 · 20010.2352/J.ImagingSci.Technol.2002.46.3.art00003 ↗
23. Mäher , J. C. 1994.Proc. IS&T's Tenth International Congress on Non-Impact Printing, 156–159. Springfield, VA: IS&T.
24. Miskinis , E. T. Proc. 6th International Congress on Non-Impact Printing. pp.101–110. Springfield, VA: IS&T.
25. 10.1098/rspa.1975.013810.1098/rspa.1975.0138 ↗
26. 10.1163/156856195X0089710.1163/156856195X00897 ↗
27. Rimai D. S. · 2001
28. Rimai D. S. · J. J. Imag. Sci. Technol. · 2002 · 46 · 20010.2352/J.ImagingSci.Technol.2002.46.3.art00003 ↗
29. 10.1098/rspa.1971.014110.1098/rspa.1971.0141 ↗
30. 10.1016/0021-9797(75)90018-110.1016/0021-9797(75)90018-1 ↗
31. Rimai D. S. · 2001
32. 10.1163/156856196X0083210.1163/156856196X00832 ↗