Study of processes of reverse intersystem crossing (RISC) and thermally activated delayed fluorescence (TADF) in organic light emitting diodes (OLEDs)
Source abstract
Abstract
Abstract A comprehensive theoretical study of reverse intersystem crossing (RISC), leading to thermally activated delayed fluorescence (TADF) is presented by deriving new expressions for the rates of RISC and TADF. Additionally, the internal and external quantum efficiencies of TADF based OLEDs have also been calculated. It is found that the calculated results agree reasonably well with the experimental results for the 11 TADF based materials selected in this study. To the best of authors' knowledge, this is the first theoretical study to present the derivation and calculation of the rates and efficiency of TADF based OLEDs.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Organic Light-Emitting Diodes Research · Organic Electronics and Photovoltaics · Conducting polymers and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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