Effects of silicone lens aging on degradation kinetics of light-emitting diode package in various accelerated testing
Source abstract
Abstract
Abstract Silicone is commonly used in light-emitting diode (LED) package as lens and/or encapsulation owing to its high light transmittance, large refractive index, and good thermal stability. However, the effect of silicone lens aging on the lumen decay and color shift of LED package is a considerable concern for package level reliability. This study empirically investigates the effects of silicone lens aging on lumen decay and color shift of LED package under three accelerated tests, namely, the constant stress-accelerated degradation test, step-up stress-accelerated degradation test, and step-down stress-accelerated degradation test (SDSADT). Results reveal that silicone lens aging substantially contributed to lumen decay and color shift of LEDs and considerably influenced the degradation kinetics of LED package. The color coordinates of LED package covered with aged silicone specimen in three testing methods exhibit a steady yellowing shift law at the same 45-degree direction. Silicone lens aging primarily reduces its transmittance to blue light as accumulated thermal oxidation and hydrolysis reaction, and its effect on the blue peak intensity of LED is independent of the stress-loaded order of step stress-accelerated degradation testing (SSADT). In addition, the effect law of silicone lens aging on LED lumen and color shift could be presented with the exponential and power function models, respectively. Lumen decay and color shift are mostly independent of the historical stress and loaded order in SSADT. The SDSADT testing manner more effectively distinguishes the color shift effect of thermal stress level compared with other accelerated tests. These findings are assumed to benefit the design and reliability assessment of LED products.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Electronic Packaging and Soldering Technologies · Engineering Applied Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (35)
Show source-provided references
1. “An approach to “Design for Reliability” in solid state lighting systems at high temperatures10.1016/j.microrel.2011.06.029 ↗
2. Firelight LED source: toward a balanced approach to the performance of solid-state lighting for outdoor environments10.1109/JPHOT.2014.2319102 ↗
3. High-color-quality multipackage phosphor-converted LEDs for yellow photolithography room lamp10.1109/JPHOT.2015.2415674 ↗
4. Light emission from a poly-silicon device with carrier injection engineering10.1016/j.mseb.2018.07.002 ↗
5. Silicon MOS optoelectronic micro-nano structure based on reverse-biased PN junction
6. Accelerated life test of high brightness light emitting diodes10.1109/TDMR.2008.919596 ↗
7. Light emitting diodes reliability review10.1016/j.microrel.2011.07.063 ↗
8. Physics-of-Failure-Based prognostics and health management for high-power white light-emitting diode lighting10.1109/TDMR.2011.2157695 ↗
9. Solid-state lighting: failure analysis of white LEDs10.1016/j.jcrysgro.2004.04.071 ↗
10. Lifetime assessment of Bisphenol-A Polycarbonate (BPA-PC) plastic lens, used in LED-based products10.1016/j.microrel.2013.09.009 ↗
11. Degradation of Microcellular PET reflective materials used in LED-based products10.1016/j.optmat.2015.07.026 ↗
12. Colour shift and mechanism investigation on the PMMA diffuser used in LED-based luminaires10.1016/j.optmat.2016.02.023 ↗
13. Color shift investigations for LED secondary optical designs: comparison between BPA-PC and PMMA10.1016/j.optmat.2015.03.005 ↗
14. Color shift acceleration on mid-power LED packages10.1016/j.microrel.2017.09.014 ↗
15. Color shift analysis and modeling of high power warm white pc-LED under high temperature and high humidity environment
16. Step-stress accelerated degradation analysis for highly reliable products10.1080/00224065.2000.11979997 ↗
17. Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method10.1016/j.microrel.2015.06.147 ↗
18. Thermal degradation kinetics of LED lamps in step-up-stress and step-down-stress accelerated degradation testing10.1016/j.applthermaleng.2016.07.065 ↗
19. Progress in understanding color maintenance in solid-state lighting systems10.15302/J-ENG-2015035 ↗
20. Thermal oxidation ageing effects on silicone rubber sealing performance10.1016/j.polymdegradstab.2016.11.017 ↗
21. Failure modes and effects analysis for high-power GaN-based light-emitting diodes package technology10.1016/j.microrel.2011.02.021 ↗
22. A review on the physical mechanisms that limit the reliability of GaN-based LEDs10.1109/TED.2009.2033649 ↗
23. Solid-state lighting: failure analysis of white LEDs10.1016/j.jcrysgro.2004.04.071 ↗
24. Effects of moist environments on LED module reliability10.1109/TDMR.2009.2038367 ↗
25. Temperature and humidity effect on aging of silicone rubbers as sealing materials for proton exchange membrane fuel cell applications10.1016/j.applthermaleng.2016.05.095 ↗
26. Illuminating Engineering Society (IES) · 2008
27. Color shift acceleration on mid-power LED packages10.1016/j.microrel.2017.09.014 ↗
28. Color shift reduction of a multi-domain IPS-LCD using RGB-LED backlight10.1364/OE.14.006243 ↗
29. S. Koh, H. Ye, M. Y. Mehr, J. Wei, and G. Q. Zhang, "Investigation of color shift of LEDs-based lighting products".
30. Degradation modeling of mid-power white-light LEDs by using Wiener process10.1364/OE.23.00A966 ↗
31. Color shift modeling of light-emitting diode lamps in step-loaded stress testing10.1109/JPHOT.2016.2634702 ↗
32. Step-stress accelerated degradation analysis for highly reliable products10.1080/00224065.2000.11979997 ↗
33. Effects of moist environments on LED module reliability10.1109/TDMR.2006.876582 ↗
34. Effect of temperature gradient on moisture diffusion in high power devices and the applications in LED packages
35. Determining the thermal stress limit of LED lamps using highly accelerated decay testing10.1016/j.applthermaleng.2016.04.012 ↗