journal article·2026-05-24

Research on cross-condition tool wear monitoring methods based on multi-channel fused data and transfer learning

Min Nie, Hua Huang, Junbo Xin, Yijun Xia

Publisher page

Abstract

Effective tool wear monitoring is essential for machining precision and efficiency. Traditional methods perform poorly under changing operating conditions due to limited generalization. To address this issue, a novel approach combining multi-channel fused data and transfer learning is proposed. An extended Kalman filter (EKF) integrates features from multiple sensor signals to construct a comprehensive fused dataset, and a squeeze-and-excitation residual network (SE-ResNet) is developed to predict tool wear. Under new conditions, only minimal multi-channel fused data are required to fine-tune the fully connected (FC) layer, enabling cross-condition prediction transfer. Experiments conducted on the NASA milling and PHM high-speed milling datasets demonstrate that the proposed method significantly outperforms single-channel approaches, reducing mean error by 55.2% and 46.2%, respectively. Pearson correlation analysis confirms stronger relationships between the fused features and tool wear. Ablation studies highlight the critical contribution of the SE attention mechanism, and comparative experiments show superior accuracy and generalization over mainstream fusion and transfer learning methods. The proposed method offers robust cross-condition performance, indicating strong potential as a foundational technique for tool wear monitoring.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced machining processes and optimization · Lubricants and Their Additives · Machine Fault Diagnosis Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Lanzhou University of Technology

Funding

National Natural Science Foundation of China · Gansu Provincial Science and Technology Major Project

References (46)

Show source-provided references
1. 10.1016/j.aei.2023.10209410.1016/j.aei.2023.102094 ↗
2. 10.1007/s00170-021-07325-710.1007/s00170-021-07325-7 ↗
3. 10.1016/j.ymssp.2021.10761710.1016/j.ymssp.2021.107617 ↗
4. 10.1177/095440541664041710.1177/0954405416640417 ↗
5. 10.1007/s00170-018-2926-510.1007/s00170-018-2926-5 ↗
6. 10.1016/j.isatra.2017.03.02410.1016/j.isatra.2017.03.024 ↗
7. 10.1016/j.compind.2021.10343610.1016/j.compind.2021.103436 ↗
8. 10.1016/j.measurement.2015.10.02910.1016/j.measurement.2015.10.029 ↗
9. 10.1016/j.jmsy.2023.03.00510.1016/j.jmsy.2023.03.005 ↗
10. 10.1007/s13369-024-09543-z10.1007/s13369-024-09543-z ↗
11. 10.1088/1361-6501/ad519b10.1088/1361-6501/ad519b ↗
12. 10.1007/s00170-017-0367-110.1007/s00170-017-0367-1 ↗
13. 10.1016/j.ymssp.2022.10913010.1016/j.ymssp.2022.109130 ↗
14. 10.1016/j.ymssp.2019.06.02110.1016/j.ymssp.2019.06.021 ↗
15. 10.1016/j.ymssp.2017.04.03010.1016/j.ymssp.2017.04.030 ↗
16. 10.1016/j.measurement.2019.02.00410.1016/j.measurement.2019.02.004 ↗
17. 10.1016/j.procir.2020.03.14010.1016/j.procir.2020.03.140 ↗
18. 10.1016/j.compind.2020.10322310.1016/j.compind.2020.103223 ↗
19. 10.1016/j.jmatprotec.2020.11690110.1016/j.jmatprotec.2020.116901 ↗
20. 10.1016/j.jmsy.2025.02.00310.1016/j.jmsy.2025.02.003 ↗
21. 10.1007/s00170-025-15472-410.1007/s00170-025-15472-4 ↗
22. 10.1080/10589759.2025.245061010.1080/10589759.2025.2450610 ↗
23. 10.1016/j.jmsy.2023.06.00410.1016/j.jmsy.2023.06.004 ↗
24. 10.3390/s1803082310.3390/s18030823 ↗
25. 10.1016/j.sna.2014.01.00410.1016/j.sna.2014.01.004 ↗
26. 10.1016/j.aei.2024.10265910.1016/j.aei.2024.102659 ↗
27. 10.1016/j.jmapro.2024.06.02710.1016/j.jmapro.2024.06.027 ↗
28. 10.1016/j.ijmachtools.2014.10.01110.1016/j.ijmachtools.2014.10.011 ↗
29. 10.1016/j.wear.2020.20360610.1016/j.wear.2020.203606 ↗
30. 10.1016/j.measurement.2021.11007210.1016/j.measurement.2021.110072 ↗
31. 10.1016/j.eswa.2024.12455610.1016/j.eswa.2024.124556 ↗
32. 10.1080/10589759.2024.240254910.1080/10589759.2024.2402549 ↗
33. 10.1088/1361-6501/ad86e110.1088/1361-6501/ad86e1 ↗
34. 10.1007/s00170-020-05548-810.1007/s00170-020-05548-8 ↗
35. 10.1016/j.jmsy.2023.02.01910.1016/j.jmsy.2023.02.019 ↗
36. 10.1108/EC-08-2023-040510.1108/EC-08-2023-0405 ↗
37. 10.1007/s00170-021-06780-610.1007/s00170-021-06780-6 ↗
38. 10.1016/j.measurement.2022.11170110.1016/j.measurement.2022.111701 ↗
39. 10.1007/s00170-024-13055-310.1007/s00170-024-13055-3 ↗
40. 10.1117/12.28079710.1117/12.280797 ↗
41. He K Zhang X Ren S et al. Deep residual learning for image recognition. 2016. [cited 2025 Jun 25]. p. 770–778. Available from: https://openaccess.thecvf.com/content_cvpr_2016/html/He_Deep_Residual_Learning_CVPR_2016_paper.html10.1109/CVPR.2016.90 ↗
42. Hu J Shen L Sun G. Squeeze-and-excitation networks. 2018 [cited 2025 Jun 25]. p. 7132–7141. Available from: https://openaccess.thecvf.com/content_cvpr_2018/html/Hu_Squeeze-and-Excitation_Networks_CVPR_2018_paper.html10.1109/CVPR.2018.00745 ↗
43. 10.1007/s00170-021-07152-w10.1007/s00170-021-07152-w ↗
44. NASA Ames Intelligent Systems Division home. n.d. [cited 2025 Jun 25]. Available from: https://www.nasa.gov/intelligent-systems-division/#milling
45. PHM society conference data challenge PHM Soc. 2010. [cited 2025 Nov 12]. Available from: https://phmsociety.org/phm_competition/2010-phm-society-conference-data-challenge/
46. 10.1177/1475921725137035810.1177/14759217251370358 ↗