The application of multiparametric analysis of Barkhausen noise using continuous wavelet transform in comparative stress testing
Source abstract
Abstract
Abstract The paper presents an application of nondestructive estimation of residual stress distribution as a function of surface layer depth. The application uses an innovative technique of wavelet analysis of Barkhausen noise, which is able to estimate the layout of properties as a function of surface layer depth over a greater range of measurement depth than other nondestructive testing methods. The estimated result of the stress distribution as a function of depth is compared with that obtained from X-ray diffraction using an electrolytic etching process. The methods give very similar results, so the wavelet analysis of Barkhausen noise is shown to be a reliable nondestructive testing method. Keywords: Surface layerBarkhausen effectResidual stressContinuous wavelet transformWavelet analysisStress distribution Notes † American Stress Technologies Inc., μSCAN 500 System v1.22 User's Manual. ‡ American Stress Technologies Inc., μSCAN 500 Operating Instructions v.1.5.3.
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Research context
OpenAlex topics: Advanced machining processes and optimization · Magnetic Properties and Applications · Image and Signal Denoising Methods
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References (23)
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