Step-stress accelerated test
Source abstract
Abstract
Most products are designed to operate for a long period of time, and in such case, life testing is a relatively lengthy procedure. Lengthy tests tend to be expensive and the result becomes available too late to be of much use. To reduce the experimental cost significantly and provide an efficient tool to assess the life distribution for highly reliable products, the Step-stress accelerated test (SSAT) was developed. An example of a SAE keyhole specimen made of RQC-100 is used to demonstrate the SSAT procedure.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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