Measurement of the residual stresses in the thin film by using reflection of the laser light beam (In Japanese: English Abstract)
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Optical Systems and Laser Technology · Surface Roughness and Optical Measurements · Laser and Thermal Forming Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.