journal article·2016-10

Creep crack propagation in gold submicron films at room temperature

Hiroyuki Hirakata, Takumi Kameyama, Ryota Kotoge, Toshiyuki Kondo, Masayuki Sakihara, Kohji Minoshima

International Journal of Fracture· Volume 201· Issue 2
Publisher page

Abstract

We conducted creep crack propagation experiments on Au freestanding films of 400 nm thickness at room temperature to determine the dominant fracture mechanics parameter. In the experiments, a crack stably propagated accompanied by creep deformation, and it was found that the crack propagation rate $$\hbox {d}a/\hbox {d}t$$ was neither uniquely characterized by the stress intensity factor nor the net stress. Furthermore, the steady-state creep J-integral $$J_s^*$$ was estimated by an approximate equation using the experimental crack center opening displacement, and the $$\hbox {d}a/\hbox {d}t-J_s^*$$ relations were observed within a narrow band irrespective of the specimen width and applied stress. The results indicated that the creep J-integral is the dominant mechanical parameter that characterizes the creep crack propagation rate in Au films.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Copper Interconnects and Reliability · Electronic Packaging and Soldering Technologies · Metal and Thin Film Mechanics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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