Incorporating small fatigue crack growth in probabilistic life prediction: Effect of stress ratio in Ti–6Al–2Sn–4Zr–6Mo

Abstract The effect of stress ratio on the statistical aspects of small fatigue crack growth behavior was studied in a duplex microstructure of Ti–6Al–2Sn–4Zr–6Mo (Ti-6-2-4-6) at 260 °C with particular emphasis on incorporating small-crack data into probabilistic life prediction and the influence of stress ratio on probabilistic lifetime limits. A Focused Ion Beam (FIB) was used to machine micro-notches in test specimens, which served as crack-initiation sites and enabled the acquisition of multiple small-crack growth data sets from single experiment. Stress ratios of −0.5, 0.05, and 0.5 were employed, and small-crack growth was monitored by the acetate replication method. Qualitatively, change in the stress ratio produced almost negligible influence on the small-crack growth behavior when plotted as crack growth rate (d a /d N ) vs. applied stress intensity factor range (Δ K ). A probabilistic method was employed to represent the variability in the small-crack growth behavior and the statistical differences with respect to stress ratio where a method of optimization of the small-crack growth model parameters, based on a minimization of the error between the predicted and the measured crack length vs. cycles ( a vs. N ) data, was used. In spite of qualitative similarity, differences in the statistical parameters of small-crack growth as a function of stress ratio were found to be significant in life prediction. The methods for representation and probabilistic treatment of small-crack data were also shown to be important factors in incorporation of the small-crack regime in probabilistic life prediction.