article·2011-05-21

Pattern classification of fabric defects using support vector machines

Anindya Ghosh, Tarit Guha, R. Bhar, Subhasis Das

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Abstract

Purpose The purpose of this paper is to address a solution to the problem of defect recognition from images using the support vector machines (SVM). Design/methodology/approach A SVM‐based multi‐class pattern recognition system has been developed for inspecting commonly occurring fabric defects such as neps, broken ends, broken picks and oil stain. A one‐leave‐out cross validation technique is applied to assess the accuracy of the SVM classifier in classifying fabric defects. Findings The investigation indicates that the fabric defects can be classified with a reasonably high degree of accuracy by the proposed method. Originality/value The paper outlines the theory and application of SVM classifier with reference to pattern classification problem in textiles. The SVM classifier outperforms the other techniques of machine learning systems such as artificial neural network in terms of efficiency of calculation. Therefore, SVM classifier has great potential for automatic inspection of fabric defects in industry.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Spectroscopy and Chemometric Analyses · Image Processing Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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