journal article·2024-11

Synthesis of sub‐micron sized SiC particles with high defect density by using polytetrafluoroethylene as an additive

Yun Xing, Bo Ren, Bin Li, Junhong Chen, Shu Yin, Huan Lin, Yuanhui Liu

Publisher page

Abstract

Abstract A new preparation process for silicon carbide (SiC) powder is developed. In the Si–(C) –PTFE–Ar system, the grain size and morphology of the product 3C–SiC were controlled by adding a carbon source (graphite) and changing the percentage of polytetrafluoroethylene (PTFE) (0%, 10%, and 20%). The experimental results showed that the SiC powders prepared using a molar ratio of 1:1 silicon powder to graphite, plus 20% PTFE have a uniform particle size distribution (∼130 nm), a lamellar structure made of spherical particle stacking, a small bandgap (1.80 eV), a high carrier concentration, and a large number of lattice defects. These properties are expected to increase the electrical conductivity of 3C–SiC and decrease its thermal conductivity, thus providing a promising feedstock preparation option for SiC thermoelectric materials. In addition, the mechanism of PTFE in the preparation of SiC reactions was studied in detail.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced ceramic materials synthesis · Aluminum Alloys Composites Properties · Silicon Carbide Semiconductor Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Materials Science and Engineering University of Science and Technology Beijing Beijing China

Institute of Multidisciplinary Research for Advanced Materials Tohoku University Aoba‐ku Sendai Japan

Advanced Institute for Materials Research (WPI‐AIMR) Tohoku University Aoba‐ku Sendai Japan

Funding

National Natural Science Foundation of China

References (47)

Show source-provided references
1. 10.1007/BF0168932010.1007/BF01689320 ↗
2. 10.1016/S0022-3115(97)00258-410.1016/S0022-3115(97)00258-4 ↗
3. 10.1146/annurev-matsci-062910-10045310.1146/annurev-matsci-062910-100453 ↗
4. 10.1557/mrs2006.4910.1557/mrs2006.49 ↗
5. AbderrazakH HmidaE.Silicon carbide: synthesis and properties. Properties and applications of silicon carbide. InTech;2011. p.361–388.10.5772/15736 ↗
6. 10.1557/mrs2005.7310.1557/mrs2005.73 ↗
7. 10.1016/j.ceramint.2022.01.09710.1016/j.ceramint.2022.01.097 ↗
8. 10.1016/j.matchar.2008.06.00110.1016/j.matchar.2008.06.001 ↗
9. 10.1016/j.powtec.2006.08.00310.1016/j.powtec.2006.08.003 ↗
10. 10.1016/S0925-9635(98)00201-510.1016/S0925-9635(98)00201-5 ↗
11. 10.1016/j.corsci.2021.10942110.1016/j.corsci.2021.109421 ↗
12. 10.1016/S0921-5093(00)01293-410.1016/S0921-5093(00)01293-4 ↗
13. 10.1039/C4CE01587H10.1039/C4CE01587H ↗
14. 10.1016/j.pmatsci.2020.10073410.1016/j.pmatsci.2020.100734 ↗
15. 10.1016/j.mtchem.2023.10141910.1016/j.mtchem.2023.101419 ↗
16. 10.1007/s10853-006-0461-510.1007/s10853-006-0461-5 ↗
17. 10.1016/j.jallcom.2019.02.17910.1016/j.jallcom.2019.02.179 ↗
18. 10.4028/www.scientific.net/MSF.228-231.66310.4028/www.scientific.net/MSF.228-231.663 ↗
19. 10.1038/srep1879110.1038/srep18791 ↗
20. 10.1016/j.sse.2016.04.00610.1016/j.sse.2016.04.006 ↗
21. 10.1007/BF0072018510.1007/BF00720185 ↗
22. 10.1016/j.jallcom.2018.11.06710.1016/j.jallcom.2018.11.067 ↗
23. 10.1016/j.elecom.2016.06.01210.1016/j.elecom.2016.06.012 ↗
24. 10.1016/j.jnucmat.2014.06.05510.1016/j.jnucmat.2014.06.055 ↗
25. 10.1016/S0169-4332(01)00491-310.1016/S0169-4332(01)00491-3 ↗
26. ChenJ LiuW YangT LiB SuJ HouX et al.A facile synthesis of a three‐dimensional flexible 3C–SiC sponge and its wettability. Cryst Growth Des.2014;14:4624–4630.10.1021/cg500723y ↗
27. 10.1103/PhysRevB.65.03320310.1103/PhysRevB.65.033203 ↗
28. 10.1016/j.actamat.2012.02.04710.1016/j.actamat.2012.02.047 ↗
29. PoudelB HaoQ MaY MinnichA MutoA LanY C et al.High thermoelectric performance of nanostructured bismuth antimony telluride bulk alloys. APS March Meeting;2008.
30. 10.1016/j.actamat.2017.08.03010.1016/j.actamat.2017.08.030 ↗
31. 10.1016/j.diamond.2014.11.01110.1016/j.diamond.2014.11.011 ↗
32. Assessing biaxial stress and strain in 3C–SiC/Si (001) by Raman scattering spectroscopy
33. 10.1103/PhysRevB.5.58010.1103/PhysRevB.5.580 ↗
34. 10.1016/j.tsf.2007.06.09810.1016/j.tsf.2007.06.098 ↗
35. 10.1002/adfm.20060081610.1002/adfm.200600816 ↗
36. 10.1088/0022-3727/44/13/13300110.1088/0022-3727/44/13/133001 ↗
37. 10.1063/1.33883010.1063/1.338830 ↗
38. 10.1016/j.mseb.2021.11545210.1016/j.mseb.2021.115452 ↗
39. 10.1016/j.carbon.2009.11.01010.1016/j.carbon.2009.11.010 ↗
40. 10.1111/j.1551-2916.2008.02526.x10.1111/j.1551-2916.2008.02526.x ↗
41. 10.1016/j.jallcom.2010.08.15610.1016/j.jallcom.2010.08.156 ↗
42. 10.1016/j.jallcom.2008.07.07010.1016/j.jallcom.2008.07.070 ↗
43. 10.1016/j.cjph.2017.06.01210.1016/j.cjph.2017.06.012 ↗
44. 10.1007/BF0072871310.1007/BF00728713 ↗
45. 10.1111/j.1151-2916.2000.tb01593.x10.1111/j.1151-2916.2000.tb01593.x ↗
46. 10.1134/S106378262008005910.1134/S1063782620080059 ↗
47. 10.1016/j.matlet.2009.10.03510.1016/j.matlet.2009.10.035 ↗