Influences of Liquid‐Phase Sintering on Structure, Grain Growth, and Dielectric Behavior of PbZr _0.52 Ti _0.48 O ₃ Ceramics

In this work, to formulate piezoceramic systems such as PbZr _0.52 Ti _0.48 O ₃ ( PZT ) for low‐temperature co‐fired ceramic ( LTCC )‐based devices, liquid‐phase sintering approach is demonstrated. ZnO–B ₂ O ₃ ( ZB ) binary glass system is used as sintering aid. X‐ray diffraction ( XRD ) study confirms the formation of morphotropic phase boundary ( MPB ; tetragonal + rhombohedral) in PZT prepared by hydrothermal route. ZB is found to induce change in tetragonal/rhombohedral ratio in MPB of PZT . 1% ZB in PZT is found to raise the tetragonality from 71% to 92% in MPB region of PZT . ZB addition in PZT has reduced the sintering temperature from 1250 to 825°C for relative density about 91% with sustaining MPB phase. 1% ZB content is optimal percentage to enhance sinterability and relative density. Uniform dispersion of glass in PZT matrix is confirmed by SEM images. ZB content in PZT is found to controlling grain growth during sintering. Highest dielectric constant and lowest dielectric loss with low sintering temperature (825°C) of 1% ZB among all glass added in PZT exhibit technical suitability of 1% ZB + PZT to use as LTCC ‐based energy storage devices.