The application of static secondary ion mass spectrometry to the study of epoxy adhesive constituents
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Abstract
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Research context
OpenAlex topics: Metal and Thin Film Mechanics · Ion-surface interactions and analysis · Surface Modification and Superhydrophobicity
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References (16)
Show source-provided references
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3. 1989
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5. Analysis of polymer surfaces by SIMS
6. Briggs · 1989
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8. Fast atom bombardment mass-spectrometry for applied surface-analysis10.1002/sia.740040407 ↗
9. A comparison of atom and ion induced SSIMS—evidence for a charge induced damage effect in insulator materials10.1016/0584-8547(85)80141-5 ↗
10. Gel permeation chromatographic analysis of commercial epoxy resins
11. Static secondary ion mass analysis of polycarbonate surfaces10.1016/0032-3861(88)90006-7 ↗
12. High-resolution monochromated XPS of poly(methyl methacrylate) thin films on a conducting substrate10.1002/sia.740170206 ↗
13. Epoxy resin cure II. FTIR analysis10.1002/app.1984.070291207 ↗
14. Vickerman · 1989 · 911
15. A comparison of positive and negative ion static SIMS of polymer surfaces10.1002/sia.740080207 ↗
16. Treverton, J.A., Paul, A.J. and Vickerman, J.C. ‘ToF-SIMS of epoxy adhesives and adhesive constituents’ (in preparation)