Structure and composition of aluminum oxide films in contact with the liquid In-Ga eutectic
Source abstract
Abstract
The oxide layers on the surface of aluminum metal and the aluminum alloys AD-1 and A-5 have been studied by attenuated total reflection infrared spectroscopy. The Al-O and Al-OH surface vibrational modes and A-O modes of the AlO 4 and AlO 6 groups have been identified. The structural inhomogeneity of the surface oxide layers is shown to contribute to their disruption when the sample is brought into contact with the liquid In-Ga eutectic. In situ scanning electron microscopy and X-ray microanalysis have been used to follow the dynamics of oxide layer disruption and the morphological and compositional changes in the eutectic alloy and the surface layer of aluminum.
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Research context
OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Optical Coatings and Gratings
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References (11)
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