journal article·2009-12

Quantitative analysis of void morphology in Fe-40 wt.%Ni alloy by electron holography

Ulugbek Shaislamov, Jun-Mo Yang, Jung Ho Yoo, Junghoon Yoo, Dae-Hwang Yoo, Keesam Shin, Yong Sang Na, Kyoung Sik Cho, Jonghoon Lee, Beelyong Yang

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Abstract

In this paper, we briefly report on a detailed investigation of the morphology of voids in the Fe-40 wt.%Ni alloy using the electron holography technique. By analyzing the phase shift across the voids, we could obtain visual information on their morphology. Moreover, the obtained thickness profiles of the voids allowed us to measure quantitatively their depth and width. The obtained results are very important for further investigations of the 3-dimensional (3D) morphology of void-type defects in the material.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Microstructure and Mechanical Properties of Steels · Advanced Materials Characterization Techniques · Microstructure and mechanical properties

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References (12)

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1. A. Tonomura, Electron Holography, 2nd ed., p. 2–8, Springer, Berlin, Heidelberg, New York, Tokyo (1999).10.1007/978-3-540-37204-2_2 ↗
2. E. Völkl, L. F. Allard, and D. C. Joy, Introduction to Electron Holography, p. 17–43, Kluwer Academic, New York (1999).10.1007/978-1-4615-4817-1 ↗
3. D. Shindo and T. Oikawa, Analytical Electron Microscopy for Materials Science, p. 116–125, Springer, Tokyo (2002).10.1007/978-4-431-66988-3 ↗
4. M. R. McCartney and D. J. Smith, Ultramicrosc. 94, 149 (2003).10.1016/S0304-3991(02)00260-7 ↗
5. W. D. Rau, P. Schwander, F. H. Baumann, W. Höppner, and A. Ourmazd, Phys. Rev. Lett. 82, 2614 (1999).10.1103/PhysRevLett.82.2614 ↗
6. T. Kasahara, D. Shindo, H. Yoshikawa, T. Sato, and K. Kondo, J. Electron Microsc. 56, 7 (2007).10.1093/jmicro/dfl042 ↗
7. H. S. Park, Y. Murakami, D. Shindo, V. A. Chernenko, and T. Kanomata, App. Phys. Lett. 83, 3752 (2003).10.1063/1.1624633 ↗
8. J. Chengge and C. David, J. Electron. Microsc. 51, 105 (2002).10.1093/jmicro/51.2.105 ↗
9. E. Müller, D. Gerthsen, P. Brückner, F. Scholz, Th. Gruber, A. Waag, Pys. Rev. B 73, 245316-1–9 (2006).
10. B.-J. Lee, J.-H. Shim, and J. H. Kwon, Met. Mater. Int. 14, 283 (2008).10.3365/met.mat.2008.06.283 ↗
11. A. Tonomura, Electron Holography, 2nd ed., p. 78–82, Springer, Berlin, Heidelberg, New York, Tokyo (1999).10.1007/978-3-540-37204-2_7 ↗
12. E. Völkl, L. F. Allard, and D. C. Joy, Introduction to Electron Holography, p. 267–293, Kluwer Academic, New York (1999).10.1007/978-1-4615-4817-1 ↗