Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD
Source abstract
Abstract
The strain profile in the subsurface of He-ion-irradiated W was figured out by unfolding the synchrotron-grazing incidence X-ray diffraction (S-GIXRD) patterns at different incidence angles. The results show that for 2 × 1021 ions/m2 He2+-irradiated W, in addition to a compressive strain exists in the depths of 0–100 nm due to mechanical polishing, an expansion strain appears in the depth beyond 100 nm owing to irradiation-induced lattice swelling. This work provides a reference for the study of irradiation damage in the subsurface by S-GIXRD.
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Research context
OpenAlex topics: Fusion materials and technologies · Ion-surface interactions and analysis · Advanced materials and composites
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Key Laboratory of Materials Physics, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China
Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China
Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China
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Show source-provided references
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