Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy
Source abstract
Abstract
(1998). Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy. Critical Reviews in Solid State and Materials Sciences: Vol. 23, No. 2, pp. 65-203.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.