Normal and Lateral Force Calibration Techniques for AFM Cantilevers

Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for quantification of normal and lateral forces exerted on the AFM tip while interacting with the surface of materials. In order to measure these forces, an accurate determination of the normal and lateral forces exerted on the AFM cantilever is necessary. To date, there is no generally accepted technique for the force calibration of AFM cantilevers. In this paper, we present a critical review of various techniques for measuring cantilever stiffness in the normal and lateral/torsional directions in order to calibrate the normal and lateral forces exerted on AFM cantilevers. The key concepts of each technique are presented, along with a discussion of their advantages and disadvantages. An understanding of the issues involved in the determination of the stiffness is needed for the proper choice and implementation of any given technique.