journal article·2023-06

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

Jinshan Pan, Xiaoqi Yue, Per Malmberg, Elisa Isotahdon, Vilma Ratia-Hanby, Elina Huttunen-Saarivirta, Christofer Leygraf

Corrosion Science· Volume 217
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Abstract

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OpenAlex topics: Electrochemical Analysis and Applications · Corrosion Behavior and Inhibition · Analytical Chemistry and Sensors

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References (13)

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1. Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)10.1016/j.corsci.2022.110833 ↗
2. A. Hedin, C. Lilja, F. King, D.W. Shoesmith, P.G. Keech, Comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”, Corros. Sci., submitted.
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11. Corrosion-induced microstructure degradation of copper in sulfide containing simulated anoxic groundwater studied by synchrotron high-energy X-ray diffraction and ab-initio density functional theory calculation10.1016/j.corsci.2021.109390 ↗
12. Comment on “Corrosion-induced microstructure degradation of copper in sulfide-containing simulated anoxic groundwater studied by synchrotron high-energy X-ray diffraction and Ab-initio density functional theory calculation10.1016/j.corsci.2022.110182 ↗
13. Reply to comment on “corrosion-induced microstructure degradation of copper in sulfide-containing simulated anoxic groundwater studied by synchrotron high-energy X-ray diffraction and ab-initio density functional theory calculation”10.1016/j.corsci.2022.110183 ↗