Untersuchungen über den einflu dermagnetischen umwandlung auf das anodische verhalten von Ni-W und Ni-V-Legierungen
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OpenAlex topics: Anodic Oxide Films and Nanostructures · Copper Interconnects and Reliability · Semiconductor materials and interfaces
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References (12)
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12. Geus · J. Catal. · 1966 · 6 · 10810.1016/0021-9517(66)90115-1 ↗