Potentiostatic testing of plasma-deposited silicon nitride thin protective films for bonds, bondwires and bondpads in microelectronic assemblies
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Research context
OpenAlex topics: Concrete Corrosion and Durability · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis
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References (15)
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14. Jain · Corrosion-NACE · 1986 · 42 · 70010.5006/1.3583044 ↗
15. de Wexler · J. electrochem. Soc. · 1974 · 121 · 127110.1149/1.2401665 ↗