The determination of oxide film thickness and composition on indium and chromium by decomposition of auger electron spectra
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Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Non-Destructive Testing Techniques
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References (3)
Show source-provided references
1. Montgomery · 1982
2. Fowler · J. Vac. Sci. Technol. · 1982 · 20 · 93010.1116/1.571645 ↗
3. Frankenthal · 1978 · 262