A photo-electron and secondary ion mass spectrometric study of the chemical composition of thermal oxide layers on technically pure aluminium
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices · Ion-surface interactions and analysis
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References (8)
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1. Scofield · J. Electr. Spectrosc. · 1976 · 8 · 12910.1016/0368-2048(76)80015-1 ↗
2. Battye · Phys. Rev. · 1974 · B9 · 288710.1103/PhysRevB.9.2887 ↗
3. Powell · Surf. Sci. · 1974 · 44 · 2910.1016/0039-6028(74)90091-0 ↗
4. Penn · J. Electr. Spectrosc. · 1976 · 9 · 2910.1016/0368-2048(76)85004-9 ↗
5. Döllino · Erzmetall · 1979 · 32 · 161
6. Goldstein · Surf. Sci. · 1978 · 71 · 1510.1016/0039-6028(78)90310-2 ↗
7. Brock · J. electrochem. Soc. · 1972 · 119 · 112410.1149/1.2404413 ↗
8. Grauer · Werkstoffe Korros. · 1981 · 32 · 34010.1002/maco.19810320806 ↗