journal article·1990-01

Characterization of passive films on Ni and Ni alloys by ReflEXAFS and raman spectroscopy

R. Cortes, M. Froment, A. Hugot-Le Goff, S. Joiret

Corrosion Science· Volume 31
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Corrosion Behavior and Inhibition · Semiconductor materials and interfaces · Semiconductor materials and devices

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References (10)

Show source-provided references
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4. Bosio · Surface and Interface Analysis · 1988 · 12 · 38010.1002/sia.740120703 ↗
5. Delichère · Surface and Interface Analysis · 1988 · 12 · 41910.1002/sia.740120710 ↗
6. Sayers · 1988 · 211
7. Marcus · J. Electrochem. Soc. · 1988 · 135 · 270610.1149/1.2095415 ↗
8. Macdonald · J. Electrochem. Soc. · 1989
9. Blondeau · Physica Status Solidi (a) · 1974 · 26 · 18110.1002/pssa.2210260117 ↗
10. Dean · Corrosion Science · 1989 · 29 · 19910.1016/0010-938X(89)90030-9 ↗