Observations of anomalies in the anodic behaviour of microcrystalline aluminium
Source abstract
Abstract
The anodic behaviour of sputtered microcrystalline Al (mc-Al) was investigated in neutral Na(2)SO(4) electrolyte under varied conditions. Our results revealed that Cl(-) addition led to a reduction in the anodic current density, which we considered unusual. Mott-Schottky analysis showed that Cl introduction altered the semiconducting property of the passive film from n-type to p-type, implying that the p-type film can possessed a relative higher stability. Immersion of mc-Al in other electrolytes yielded films with n-type, p-type and positive p-n junction structure. The results also indicate that the p-type film was most stable and the positive p-n junction film least stable. (C) 2010 Elsevier Ltd. All rights reserved.
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Research context
OpenAlex topics: Anodic Oxide Films and Nanostructures · Corrosion Behavior and Inhibition · Semiconductor materials and devices
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References (18)
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