In situ determination of high-temperature oxidation evolution using micro-pillar array and scanning probe microscopy
Source abstract
Abstract
Understanding the chemo-mechanics during oxidation is of great importance for designing novel countermeasures for materials protections. However, it is yet challenging to accurately measure the coupled mechanical stress/strain components at micro-/nanoscale. In this work, we propose a novel method to combine surface markers (SiO 2 micro-pillars) and high temperature scanning probe microscopy (HTSPM) for quantifying the growing oxide thickness, while mapping the local displacement and strain fields at the surface of a nickel-based alloy during high temperature oxidation. The proposed method displays great potential in quantitatively mapping the non-uniform oxide distribution, providing a novel approach to investigate the high-temperature oxidation process.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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