Initial stages of the anodic etching of aluminum foils studied by atomic force microscopy
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OpenAlex topics: Anodic Oxide Films and Nanostructures · Corrosion Behavior and Inhibition · Nanopore and Nanochannel Transport Studies
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References (28)
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1. H. Fickelscher, Werkstoffe und Korrosion 33 (1982) 146.10.1002/maco.19820330305 ↗
2. R. S. Alwitt, H. Uchi, T.R. Beck, R.C. Alkire, J. Electrochem. Soc. 131 (1984) 13.10.1149/1.2115495 ↗
3. K. Hebert, R. Alkire, J. Electrochem. Soc. 135 (1988) 2146.10.1149/1.2096231 ↗
4. K. Hebert, R. Alkire, J. Electrochem. Soc. 135 (1988) 2447.10.1149/1.2095356 ↗
5. J.-H. Jeong, C.-H. Choi, D.N. Lee, J. Mat. Sci. 31 (1996) 5811.10.1007/BF01160833 ↗
6. D. Goad, J. Electrochem. Soc. 144 (1997) 1965.10.1149/1.1837730 ↗
7. C. G. Dunn, R.B. Bolon, A.S. Alwan, A.W. Stirling, J. Electrochem. Soc. 118 (1971) 381.10.1149/1.2408057 ↗
8. R. B. Diegle, J. Electrochem. Soc. 121 (1974) 583.10.1149/1.2401863 ↗
9. K. Arai, T. Suzuki, T. Atsumi, J. Electrochem. Soc. 132 (1985) 1667.10.1149/1.2114188 ↗
10. X. Wu, K. Hebert, J. Electrochem. Soc. 143 (1996) 83.10.1149/1.1836390 ↗
11. W. Lin, G.C. Tu, C.F. Lin, Y.M. Peng, Corr. Sci. 38 (1996) 889.10.1016/0010-938X(96)00175-8 ↗
12. W. Lin, G.C. Tu, C.F. Lin, Y.M. Peng, Corr. Sci. 39 (1997) 1531.10.1016/S0010-938X(97)00052-8 ↗
13. R. A. Mirzoev, L.A. Pavlov, L.A. Kostelova, V.F. Pimenov, Journal of Applied Chemistry of the USSR 63 (1990) 938.
14. X. Wu, P. Asoka-Kumar, K.G. Lynn, K.R. Hebert, J. Electrochem. Soc. 141 (1994) 3361.10.1149/1.2059340 ↗
15. C.-F. Lin, K.R. Hebert, J. Electrochem. Soc. 137 (1990) 3723.10.1149/1.2086293 ↗
16. J. Flis, L. Kowalczyk, J. Appl. Electrochem. 25 (1995) 501.10.1007/BF00260695 ↗
17. M. S. Hunter, J. Electrochem. Soc. 117 (1970) 1215.10.1149/1.2407775 ↗
18. A. Hibino, M. Tamaki, Y. Watanabe, T. Oki, Keikinzoku 42 (1992) 440.10.2464/jilm.42.440 ↗
19. B. J. Wiersma, K.R. Hebert, J. Electrochem. Soc. 138 (1991) 48.10.1149/1.2085577 ↗
20. C. K. Dyer, R.S. Alwitt, J. Electrochem. Soc. 128 (1981) 300.10.1149/1.2127408 ↗
21. Y. Tak, E.R. Henderson, K.R. Hebert, J. Electrochem. Soc. 141 (1994) 1446.10.1149/1.2054944 ↗
22. E. Makino, T. Yajima, T. Shibata, M. Ikeda, Y. Tanno, E. Suganuma, Materials Transactions, JIM 34 (1993) 796.10.2320/matertrans1989.34.796 ↗
23. P. L.J. Gunter, J.W. Niemantsverdriet, J. Vac. Sci. Technol. A 13 (1995) 1290.10.1116/1.579552 ↗
24. R. E. Ricker, A.E. Miller, D.-F. Yue, G. Banerjee, S. Bandyopadhyay, Journal of Electronic Materials 25 (1996) 1585.10.1007/BF02655580 ↗
25. K. Shimizu, K. Kobayashi, P. Skeldon, G.E. Thompson, G.C. Wood, Corr. Sci. 39 (1997) 701.10.1016/S0010-938X(97)89337-7 ↗
26. T. Ebel, unpublished.
27. K. Shimizu, R.C. Furneaux, G.E. Thompson, G.C. Wood, A. Gotoh, K. Kobayashi, Oxidation of Metals 35 (1991) 427.10.1007/BF00664713 ↗
28. T. R. Beck, H. Uchi, K.R. Hebert, J. Appl. Electrochem. 19 (1989) 69.10.1007/BF01039392 ↗