Anomalous temperature dependence mechanism of the electrochemical dissolution efficiency of iron-based materials
Source abstract
Abstract
In tests of typical iron-based materials, it has been found that the dissolution efficiency at low temperature is greater than that at ambient temperature. By utilizing sputtering X-ray photoelectron spectroscopy (sputtering XPS) and focused ion beam scanning electron microscopy (FIB-SEM), it was found that this abnormal phenomenon is rooted in a thinner passive film and lower valence oxides formed on the surface at low temperature. Transmission electron microscopy (TEM) analysis supported these conclusions at the microscopic level. First-principles calculations further revealed that lower valence oxides of iron are more conductive than higher valence oxides.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Hydrogen embrittlement and corrosion behaviors in metals · Corrosion Behavior and Inhibition · Metallurgical Processes and Thermodynamics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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