Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide
Source abstract
Abstract
1
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced materials and composites · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (75)
Show source-provided references
1. Upadhyaya · 1998
2. Diffusion Phenomena in Thin Films and Microelectronic Materials
3. Thin Film Structures in Energy Applications
4. Chopra · 1983
5. Diffusion of adhesion layer metals controls nanoscale memristive switching10.1002/adma.201000663 ↗
6. Characterization of thin titanium oxide adhesion layers on gold: resistivity, morphology, and composition10.1016/0039-6028(94)91300-5 ↗
7. Aging properties of gold layers with different adhesion layers10.1016/0040-6090(76)90603-9 ↗
8. Performance of Zr and Ti adhesion layers for bonding of platinum metallization to sapphire substrates10.1016/S0925-4005(01)00756-0 ↗
9. Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability10.1063/1.1839637 ↗
10. Failure mechanism models for material aging due to interdiffusion10.1109/24.285101 ↗
11. Thin Films: Interdiffusion and Reactions
12. Ohring · 2001
13. Design of protective coatings for glass lens molding
14. Correlation between chemical glass components and the glass sticking on sputtered PtIr physical vapour deposition coatings for precision blank moulding
15. Influence of interlayer thickness of a thin noble metal MSIP-PVD coating on compound and system properties for glass lens moulding10.1007/s11740-012-0385-7 ↗
16. Process chain for the replication of complex optical glass components
17. Compression molding of aspherical glass lenses-A combined experimental and numerical analysis10.1111/j.1551-2916.2005.00137.x ↗
18. Precision glass molding: toward an optimal fabrication of optical lenses
19. Monji · 1988
20. Adhesive interlayers’ effect on the entire structure strength of glass molding tools’ Pt–Ir coatings by nano-tests determined10.1016/j.surfcoat.2011.07.060 ↗
21. Novel testing facility for investigating wear on PGM sample tools10.1117/12.2026995 ↗
22. Investigation of the effects of process parameters on the glass-to-mold sticking force during precision glass molding10.1016/j.surfcoat.2010.06.049 ↗
23. Model of coating wear degradation in precision glass molding10.1007/s00170-015-8005-2 ↗
24. Interdiffusion and reaction in bimetallic Cu-Sn thin films10.1016/0001-6160(73)90190-9 ↗
25. Interdiffusion of an Au/Ni/Cr multilayer metallization on silicon substrates10.1016/0040-6090(89)90535-X ↗
26. Tantalum as a diffusion barrier between copper and silicon: failure mechanism and effect of nitrogen additions10.1063/1.350566 ↗
27. Thermal stability under air of tungsten–titanium diffusion barrier layer between silica and platinum10.1016/j.corsci.2013.09.018 ↗
28. Annealing and oxidation study of Mo?Ru hard coatings on tungsten carbide10.1016/j.tsf.2009.07.084 ↗
29. Thermally induced atomic diffusion at the interface between release agent coating and mould substrate in a glass moulding press10.1088/0022-3727/44/21/215302 ↗
30. Enhanced diffusion caused by surface reactions in thin films of Sn–Cu–Mn10.1016/j.tsf.2013.10.143 ↗
31. Thin-film interdiffusion. I. Au-Pd, Pd-Au, Ti-Pd, Ti-Au, Ti-Pd-Au, and Ti-Au-Pd10.1063/1.321411 ↗
32. Interdiffusion and compound formation in the Mo/Pd/Si thin film metallization system10.1016/0040-6090(86)90178-1 ↗
33. Interface-directed spinodal decomposition in TiAlN/CrN multilayer hard coatings studied by atom probe tomography10.1016/j.actamat.2013.08.028 ↗
34. Thermal dissolution mechanisms of AlN/CrN hard coating superlattices studied by atom probe tomography and transmission electron microscopy10.1016/j.actamat.2014.11.004 ↗
35. Thermal stability of TiAlN/CrN multilayer coatings studied by atom probe tomography10.1016/j.ultramic.2010.11.012 ↗
36. Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films10.1063/1.4929874 ↗
37. Stability and thermal reaction of GMR NiFe/Cu thin films10.1016/j.actamat.2005.03.038 ↗
38. Triple junction transport and the impact of grain boundary width in nanocrystalline Cu10.1021/nl300751q ↗
39. A novel laboratory set-up for investigating surface and interface reactions during short term annealing cycles at high temperatures10.1063/1.4817310 ↗
40. Some aspects of atom probe specimen preparation and analysis of thin film materials10.1016/j.ultramic.2004.01.010 ↗
41. Sample preparation for atomic-resolution STEM at low voltages by FIB10.1016/j.ultramic.2012.01.005 ↗
42. Evaluation of analysis conditions for laser-pulsed atom probe tomography: example of cemented tungsten carbide10.1017/S1431927616012654 ↗
43. Substrate rotation-induced chemical modulation in Ti-Al-O-N coatings synthesized by cathodic arc in an industrial deposition plant10.1016/j.surfcoat.2016.08.046 ↗
44. Layer formation by resputtering in Ti–Si–C hard coatings during large scale cathodic arc deposition10.1016/j.surfcoat.2011.02.007 ↗
45. Age hardening in arc-evaporated ZrAlN thin films10.1016/j.scriptamat.2010.01.049 ↗
46. Birks · 2006
47. Correlations for diffusion constants10.1016/0001-6160(80)90092-9 ↗
48. Influence of dislocations on diffusion kinetics in solids with particular reference to the alkali halides10.1039/tf9615701191 ↗
49. Mehrer · 2007
50. Low-temperature diffusion of copper through gold10.1063/1.323265 ↗
51. Effect of CO on the low temperature diffusion of Cr and Si through thin gold films10.1149/1.2129894 ↗
52. Interdiffusion in antiferromagnetic/ferromagnetic exchange coupled NiFe/IrMn/CoFe multilayer10.1063/1.1427400 ↗
53. Interdiffusion in thin conductor films – chromium/gold, nickel/gold and chromium silicide/gold10.1007/BF02662726 ↗
54. Formation of silicon oxide over gold layers on silicon substrates10.1063/1.1661782 ↗
55. Relative rates of nickel diffusion and copper diffusion through gold10.1063/1.324045 ↗
56. Growth kinetics of planar binary diffusion couples: “thin-film case” versus “bulk cases”10.1063/1.331028 ↗
57. Review of binary alloy formation by thin film interactions10.1116/1.570170 ↗
58. On the formation of Ni and Pt silicide first phase: the dominant role of reaction kinetics10.1063/1.90269 ↗
59. Compound formation in metal—semiconductor interactions10.1016/0022-0248(78)90465-7 ↗
60. Phase diagrams and metal-rich silicide formation10.1063/1.325626 ↗
61. Phase formation in Cr-Si thin-film interactions10.1063/1.91767 ↗
62. Interdiffusion in thin films10.1146/annurev.ms.15.080185.001051 ↗
63. Intermetallic compound formation in thin-film and in bulk samples of the Ni-Si binary system10.1063/1.332034 ↗
64. Zinc diffusion in alpha brass
65. Paul · 2014
66. Influence of intermetallic phases and Kirkendall-porosity on the mechanical properties of joints between steel and aluminium alloys10.1016/j.msea.2011.02.057 ↗
67. Interaction of O2 with WC(0001)10.1016/S0039-6028(98)00193-9 ↗
68. Mechanism of the early stages of oxidation of WC-Co cemented carbides10.1016/j.corsci.2015.11.007 ↗
69. Investigation of void formation beneath thin AlN layers by decomposition of sapphire substrates for self-separation of thick AlN layers grown by HVPE10.1016/j.jcrysgro.2010.04.008 ↗
70. Formation and growth of voids and/or gas bubbles in thin films10.1016/0040-6090(82)90134-1 ↗
71. Gault · 2012
72. Invited review article: atom probe tomography10.1063/1.2709758 ↗
73. Miller · 2000
74. On the accuracy of compositional quantification for atom probe tomography10.1017/S1431927616004062 ↗
75. Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys10.1016/j.ultramic.2010.11.007 ↗