Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers
Source abstract
Abstract
Postprint version of the article "Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers", published in 2010 Corrosion Science 52 (2010) 3763–3773. Abstract Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers. Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration of P-species occurs, approximately, at the middle of the pore wall; adjacent to the pore for C-species, whereas the distribution of S-species appears to be uniform
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Research context
OpenAlex topics: Anodic Oxide Films and Nanostructures · Smart Materials for Construction · Concrete Corrosion and Durability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (30)
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