Role of ClO4− in breakdown of tin passivity in NaOH solutions

Abstract The anodic behaviour of a tin electrode in NaOH solutions containing different concentrations of NaClO4 was studied by employing potentiodynamic, potential transient under constant current density methods and complemented with scanning electron microscopy (SEM). In perchlorate-free NaOH solutions, the E/i response exhibits active/passive transition. The active region involves two anodic peaks corresponding to the formation of Sn(II) and Sn(IV) species respectively. The permanent passive layer is duplex and consists of SnO and SnO2. Additions of NaClO4 to the alkali solution, accelerates the active dissolution of tin and tends to breakdown the duplex passive layer at a certain breakdown potential. SEM examination confirms the occurrence of film breakdown. The breakdown potential decreases with an increase in ClO4− concentration, but increases with increasing both OH− concentration and scan rate. The potential–time transients display that the incubation time for pit initiation decreases with increasing both ClO4− concentration and anodic current density.