journal article·2026-03

In-depth understanding of the corrosion mechanisms of Co and Cu in chemical mechanical polishing (CMP): Insights from electrochemistry and triboelectrochemistry

Jiahui Ma, Yating Huang, Jie Cheng, Qinhua Miao, Jinchi Chen, Shirong Ge

Corrosion Science· Volume 260
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Abstract

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OpenAlex topics: Advanced Surface Polishing Techniques · Copper Interconnects and Reliability · Integrated Circuits and Semiconductor Failure Analysis

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