Mechanistic Insight into water film formation and subsequent corrosion-linked dendritic growth on PCBs
Source abstract
Abstract
Temperature and humidity fluctuations can cause condensation on a PCB surface which creates a continuous electrolyte pathway between two biased connector pads, leading to current leakage and subsequent dendrite growth. The effect of concentric droplet growth and inter-droplet layer on corrosion failure was investigated using a custom-designed test Printed Circuit Board (PCB) under simulated condensing conditions using DC chronoamperometry, in-situ imaging of the growth and coalescence of water droplets and subsequent dendrite growth, along with the COMSOL secondary current model analyzing leak currents for different droplet coalescence morphologies. While the secondary current model has limitations of not incorporating mass transport phenomena, it can still be used to get some insights into factors such as the effect of droplet coalescence on the occurrence of leakage currents, which indicate dendrite growth. Results indicate that for the investigated PCB layout, droplet coalescence is necessary to cause leakage currents and dendrites. • Droplet and current path development analyzed by in-situ DC measurement and imaging. • Complete droplet coalescence needed for dendrite growth; partial is insufficient. • Dendrites can connect points along longer paths, due to coalesced droplets. • Thin inter-droplet film of ∼100 µm gap and ≤ 20 µm height can prevent dendrite growth. • COMSOL modeling done of current changes with different water droplet shapes.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Material Properties and Processing · Recycling and Waste Management Techniques · Advanced Cellulose Research Studies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (48)
Show source-provided references
1. Corrosion challenges towards a sustainable society10.1002/maco.202213140 ↗
2. Reliability of Power Electronic Systems for EV/HEV Applications10.1109/JPROC.2020.3031041 ↗
3. Contamination profile on typical printed circuit board assemblies vs soldering process10.1108/SSMT-03-2014-0007 ↗
4. Study of interaction between Reflow solder flux and humidity in relation to failures in electronics10.1109/TCPMT.2024.3369076 ↗
5. Humidity-related failures in electronics: effect of binary mixtures of weak organic acid activators
6. Transient risk of water layer formation on PCBAs in different climates: Climate data analysis and experimental study10.1016/j.microrel.2022.114655 ↗
7. C. Dominkovics and G. Harsányi, “Effects of flux residues on surface insulation resistance and electrochemical migration,” in ISSE 2006 - 29th International Spring Seminar on Electronics Technology: Nano Technologies for Electronics Packaging, Conference Proceedings, 2006, pp. 206–210. doi: 10.1109/ISSE.2006.365387.10.1109/ISSE.2006.365387 ↗
8. A study of the factors affecting surface insulation resistance measurements10.1023/A:1006635917381 ↗
9. Corrosion in electronics10.1016/B978-0-12-409547-2.13437-7 ↗
10. Corrosion Reliability of Electronic Systems10.1149/1.2900650 ↗
11. On the electrochemical migration mechanism of tin in electronics10.1016/j.corsci.2011.06.015 ↗
12. Morphological study of silver corrosion in highly aggressive sulfur environments10.1016/j.engfailanal.2011.07.003 ↗
13. Electrochemical migration on electronic chip resistors in chloride environments10.1109/TDMR.2009.2022631 ↗
14. Electrochemical migration of lead free solder joints
15. Effect of solder mask surface chemistry and morphology on the water layer formation under humid conditions10.1109/TCPMT.2018.2792047 ↗
16. Thermal decomposition of binary mixtures of organic activators used in no-clean fluxes and impact on PCBA corrosion reliability10.1108/SSMT-05-2019-0020 ↗
17. Transformation of reflow solder flux residue under humid conditions10.1016/j.microrel.2021.114195 ↗
18. P. Capela et al., “Proceedings of the ASME 2021 International Mechanical Engineering Congress and Exposition,” 2021. [Online]. Available: 〈http://asmedigitalcollection.asme.org/IMECE/proceedings-pdf/IMECE2021/85574/V003T03A035/6827053/v003t03a035-imece2021-72478.pdf〉.
19. Comparative study of tripropylamine and naphthylamine as additives in wave solder flux: investigation of solderability and corrosion effects
20. Relative effect of solder flux chemistry on the humidity related failures in electronics10.1108/SSMT-11-2014-0022 ↗
21. Relative effect of solder flux chemistry on the humidity related failures in electronics10.1108/SSMT-11-2014-0022 ↗
22. Humidity buildup in electronic enclosures exposed to constant conditions10.1109/TCPMT.2017.2655447 ↗
23. H. Conseil-Gudla, “Parametric study of interior climate in electronic device enclosures and corrosion reliability,” PhD, Technical University of Denmark, Kongens Lyngby, 2017.
24. Electrochemical migration of tin in electronics and microstructure of the dendrites10.1016/j.corsci.2011.01.009 ↗
25. Electrochemical migration behavior of copper under a thin distilled water layer10.1016/j.corcom.2022.09.004 ↗
26. The effect of chloride ion concentration on electrochemical migration of copper
27. Electrochemical migration failure of the copper trace on printed circuit board driven by immersion silver finish
28. Electrochemical migration behaviour of Cu, Sn, Ag and Sn63/Pb37
29. X. Wei and B. Tolla, “Effect of Flux Systems on Electrochemical Migration of Lead-Free Assembly,” in Proceedings of SMTA International, Rosemont, IL, 2014. Accessed: May 10, 2024. [Online]. Available: 〈https://www.kester.com/Portals/0/Documents/Knowledge%20Base/Publications/SMTA-International-2014_Paper_Effect-of-Flux-Systems-on-Electrochemical-Migration-of-Lead-Free-Assembly.pdf〉.
30. Behaviour of electrochemical migration with solder alloys on printed circuit boards (PCBs)10.1108/03056120810918060 ↗
31. Electrochemical corrosion and electrochemical migration of 64Sn-35Bi-1Ag solder doping with xGe on printed circuit boards10.1016/j.microrel.2017.06.005 ↗
32. Printed Circuit Board Surface Finish and Effects of Chloride Contamination, Electric Field, and Humidity on Corrosion Reliability10.1007/s11664-016-4974-7 ↗
33. Prediction of the electrochemical migration induced failure on power PCBs under humidity condition — A case study10.1016/j.microrel.2022.114796 ↗
34. Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions10.1016/j.microrel.2023.115210 ↗
35. A. Sommers, A.M. Jacobi, and A.D. Sommers, “International Refrigeration and Air Conditioning Conference. Paper 931. International Refrigeration and Air Conditioning Conference at Purdue,” 2008. [Online]. Available: 〈http://docs.lib.purdue.edu/iracc/931〉.
36. “Electrochemistry Module User’s Guide,” 1998. [Online]. Available: 〈www.comsol.com/support/updates•COMSOLBlog:www.comsol.com/blogs•DiscussionForum:www.comsol.com/community•Events:www.comsol.com/events•COMSOLVideoGallery:www.comsol.com/video•SupportKnowledgeBase:www.comsol.com/support/knowledgebase〉.
37. AVNET ABACUS, “The Shift to 48V in Automotive Systems_ What You Need To Know _ Engineers’ Insight _ Avnet Abacus.” Accessed: Dec. 08, 2024. [Online]. Available: 〈https://my.avnet.com/abacus/resources/article/the-shift-to-48v-in-automotive-systems/〉.
38. Investigation of critical factors effect to predict leakage current and time to failure due to ECM on PCB under humidity10.1016/j.microrel.2021.114418 ↗
39. On the early and developed stages of surface condensation: Competition mechanism between interfacial and condensate bulk thermal resistances
40. A phase-field model of electrochemical migration for silver-based conductive adhesives10.1016/j.electacta.2023.143388 ↗
41. H. Tanaka, “Factors leading to ionic migration in lead-free solder,” 2002. Accessed: Mar. 10, 2024. [Online]. Available: 〈https://www.test-navi.com/eng/report/pdf/FactorsLeadingToIonicMigrationInLead-freeSolder.pdf〉.
42. Numerical simulation of electrochemical migration of Cu based on the Nernst-Plank equation10.1016/j.ijheatmasstransfer.2021.122268 ↗
43. The detrimental effects of water on electronic devices
44. D. Minzari, “Investigation of Electronic Corrosion Mechanisms,” PhD, Technical University of Denmark, Kongens Lyngby, 2010.
45. Effect of solder mask surface chemistry and morphology on the water layer formation under humid conditions10.1109/TCPMT.2018.2792047 ↗
46. Electrodeposition of copper from spent Li-ion batteries by electrochemical quartz crystal microbalance and impedance spectroscopy techniques10.1007/s10800-009-9996-x ↗
47. Review on modelling of corrosion under droplet electrolyte for predicting atmospheric corrosion rate
48. IPC, “IPC-2221A Generic Standard on Printed Board Design,” 2003.