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journal article·2024-07Open access

Nondestructive Single‐Atom‐Thick Crystallographic Scanner via Sticky‐Note‐Like van der Waals Assembling–Disassembling (Adv. Mater. 30/2024)

Ji‐Yun Moon, Seung‐Il Kim, Soheil Ghods, Seungil Park, Seunghan Kim, SooHyun Chang, Ho‐Chan Jang, Jun‐Hui Choi, Justin S. Kim, Sang‐Hoon Bae, Dongmok Whang, Tae‐Hoon Kim, Jae‐Hyun Lee

Advanced Materials· Volume 36· Issue 30
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Source abstract

Abstract

Nondestructive Single-Atom-Thick Crystallographic Scanner In article number 2400091, Ji-Yun Moon, Dongmok Whang, Tae-Hoon Kim, Jae-Hyun Lee, and co-workers develop an efficient, accurate, and non-destructive crystallographic scanning technique for 2D materials by leveraging sticky-note-like van der Waals (vdW) assembling-disassembling. They visualize the detailed grain structure of polycrystalline graphene by assembling it on a single-atomic-thick, single-crystalline graphene filter. The interlayer twist angle-dependent optical response arising from vdW-assembled bilayers enables accurate crystallographic scanning. The characterized polycrystalline graphene can be disassembled from the single-crystalline graphene filter while maintaining its pristine integrity.
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Research context

Nanomaterials

OpenAlex topics: Machine Learning in Materials Science · Additive Manufacturing and 3D Printing Technologies · Advanced Materials Characterization Techniques

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Affiliations

Department of Mechanical Engineering and Materials Science and Institute of Materials Science and Engineering Washington University in St. Louis St. Louis MO 63130 USA

Department of Energy Systems Research and Department of Materials Science and Engineering Ajou University Suwon 16499 South Korea

Department of Materials Science and Engineering Chonnam National University Gwangju 61186 South Korea

School of Advanced Materials Science and Engineering Sungkyunkwan University Suwon 16419 South Korea

References

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