journal article·1996-04Open access

Masthead

Authors not provided

Advanced Materials· Volume 8· Issue 4

Abstract

Derived from the highly acclaimed series 'Materials Science and Technology', this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale.T h e methods are described in Characterization of id Interfaces terms of the physics and the technology of the techniques and many high-quality images demonstrate the power of these methods in the in vestigation of surfaces and the processes which occur on them.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Nanofabrication and Lithography Techniques

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References

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