Enhanced polarization retention and softening in [001]-oriented Pb(Mg1/3Nb2/3)-PbTiO3 single crystals through corona poling
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Acoustic Wave Resonator Technologies · Dielectric materials and actuators
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (29)
Show source-provided references
1. M.C. Sekhar, E. Veena, N.S. Kumar, K.C.B. Naidu, A. Mallikarjuna, D.B. Basha, Cryst. Res. Technol. 58, 2200130 (2023). https://doi.org/10.1002/crat.20220013010.1002/crat.202200130 ↗
2. W. Jo, R. Dittmer, M. Acosta, J. Zang, C. Groh, E. Sapper, K. Wang, J. Rödel, J. Electroceram. 29, 71–93 (2012). https://doi.org/10.1007/s10832-012-9742-310.1007/s10832-012-9742-3 ↗
3. S.-E. Park, T.R. Shrout, J. Appl. Phys. 82, 1804–1811 (1997). https://doi.org/10.1063/1.36598310.1063/1.365983 ↗
4. S. Zhang, F. Li, X. Jiang, J. Kim, J. Luo, X. Geng, Prog. Mater. Sci. 68, 1–66 (2015). https://doi.org/10.1016/j.pmatsci.2014.10.00210.1016/j.pmatsci.2014.10.002 ↗
5. S. Zhang, F. Li, F. Yu, X. Jiang, H.-Y. Kee, H. Luo, T.R. Shrout, J. Korean Ceram. Soc. 55, 419–439 (2018). https://doi.org/10.4191/kcers.2018.55.5.1210.4191/kcers.2018.55.5.12 ↗
6. D.R. Patil, S.H. Park, G.-T. Hwang, J. Ryu, J. Korean Ceram. Soc. 59, 322–328 (2022). https://doi.org/10.1007/s43207-021-00172-y10.1007/s43207-021-00172-y ↗
7. S.-H. Go, K.S. Kim, J.S. Kim, C.I. Cheon, J. Korean Ceram. Soc. 60, 669–678 (2023). https://doi.org/10.1007/s43207-023-00291-810.1007/s43207-023-00291-8 ↗
8. T.T. Zate, N.R. Ko, H.L. Yu, W.J. Choi, J.W. Sun, J.H. Jeon, W. Jo, J. Korean Inst. Electr. Electron. Mater. Eng. 36(3), 214–225 (2023). https://doi.org/10.4313/JKEM.2023.36.3.210.4313/JKEM.2023.36.3.2 ↗
9. T.T. Zate, J.W. Sun, N.R. Ko, B.K. Koo, H.L. Yu, M.S. Kim, W.J. Choi, S.J. Jeong, J.H. Jeon, W. Jo, J. Korean Inst. Electr. Electron. Mater 36(4), 362–368 (2023)
10. H. Fu, R.E. Cohen, Nature 403, 281–283 (2000). https://doi.org/10.1038/3500202210.1038/35002022 ↗
11. Y. Sun, T. Karaki, Y. Yamashita, Jpn. J. Appl. Phys. 61, SB0802 (2022). https://doi.org/10.35848/1347-4065/ac3a9010.35848/1347-4065/ac3a90 ↗
12. H.-P. Kim, H. Wan, C. Luo, Y. Sun, Y. Yamashita, T. Karaki, H.-Y. Lee, X. Jiang, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 69, 3037–3047 (2022). https://doi.org/10.1109/TUFFC.2022.318123610.1109/TUFFC.2022.3181236 ↗
13. Y. Sun, T. Karaki, T. Fujii, Y. Yamashita, Jpn. J. Appl. Phys. 58, SLLC06 (2019). https://doi.org/10.7567/1347-4065/ab389c10.7567/1347-4065/ab389c ↗
14. D. Waller, A. Safari, Ferroelectrics 87, 189–195 (1988). https://doi.org/10.1080/0015019880820138110.1080/00150198808201381 ↗
15. H. Wang, J. Liu, S. Sadeghzade, R. Hou, H. Yuan, Ceram. Int. 49, 11334–11343 (2023). https://doi.org/10.1016/j.ceramint.2022.11.33310.1016/j.ceramint.2022.11.333 ↗
16. G. Lüttgens, S. Lüttgens, W. Schubert, Static electricity: understanding, controlling, applying (John Wiley & Sons, 2017)10.1002/9783527803330 ↗
17. J. Marshall, Q. Zhang, R. Whatmore, Thin Solid Films 516, 4679–4684 (2008). https://doi.org/10.1016/j.tsf.2007.08.03910.1016/j.tsf.2007.08.039 ↗
18. M. Rotan, M. Zhuk, J. Glaum, J. Eur. Ceram. Soc. 40, 5402–5409 (2020). https://doi.org/10.1016/j.jeurceramsoc.2020.06.05810.1016/j.jeurceramsoc.2020.06.058 ↗
19. C. Qiu, J. Liu, F. Li, Z. Xu, J. Appl. Phys. 125, 014102 (2019). https://doi.org/10.1063/1.506368210.1063/1.5063682 ↗
20. M.E. Lines, A.M. Glass, Principles and applications of ferroelectrics and related materials (Oxford University Press, 2001)10.1093/acprof:oso/9780198507789.001.0001 ↗
21. J. Liu, C. Qiu, L. Qiao, K. Song, H. Guo, Z. Xu, F. Li, J. Appl. Phys. 128, 094104 (2020). https://doi.org/10.1063/5.002010910.1063/5.0020109 ↗
22. C. Hong, Z. Wang, B. Su, L. Guo, X. Yang, X. Long, C. He, J. Appl. Phys. 129, 124101 (2021). https://doi.org/10.1063/5.004140010.1063/5.0041400 ↗
23. A.B. Kounga, T. Granzow, E. Aulbach, M. Hinterstein, J. Rödel, J. Appl. Phys. 104, 024116 (2008). https://doi.org/10.1063/1.295983010.1063/1.2959830 ↗
24. Y. Zhang, Z. Chen, W. Cao, Z. Zhang, Appl. Phys. Lett. 111, 172902 (2017). https://doi.org/10.1063/1.499818710.1063/1.4998187 ↗
25. I. Stolichnov, A. Tagantsev, E. Colla, N. Setter, J. Cross, J. Appl. Phys. 98, 084106 (2005). https://doi.org/10.1063/1.211217410.1063/1.2112174 ↗
26. R. Aoyagi, A. Takeda, M. Iwata, M. Maeda, T. Nishida, T. Shiosaki, Jpn. J. Appl. Phys. 47, 7689–7692 (2008). https://doi.org/10.1143/JJAP.47.768910.1143/JJAP.47.7689 ↗
27. A.K. Jonscher, J. Phys. D Appl. Phys. 24, 1633–1636 (1991). https://doi.org/10.1088/0022-3727/24/9/01710.1088/0022-3727/24/9/017 ↗
28. H. Smaoui, M. Arous, H. Guermazi, S. Agnel, A. Toureille, J. Alloys Compd. 489, 429–436 (2010). https://doi.org/10.1016/j.jallcom.2009.09.11610.1016/j.jallcom.2009.09.116 ↗
29. D. Damjanovic, Rep. Prog. Phys. 61, 1267–1324 (1998). https://doi.org/10.1088/0034-4885/61/9/00210.1088/0034-4885/61/9/002 ↗