Quantitative EFTEM study of precursor-derived Si–B–C–N ceramics
Source abstract
Abstract
Abstract Ceramic materials derived from a boron modified polysilazane were investigated by means of energy-filtering transmission electron microscopy (EFTEM). After cross-linking of the polymer and subsequent thermolysis, a coarse powder with average composition Si24.0B8.0C44.0N24.0 is obtained. For further investigation, monolithic particles with sizes of several millimeters were heat treated in crucibles under a flowing nitrogen atmosphere at 1800 °C for 10 h. During thermolysis, the particles developed internal cracks on the macroscopic scale. At the crack surfaces, a layer of pure carbon was found. In the crack-free region, the material is composed of Si3N4 and SiC nano crystallites which are embedded in a turbostratic BNC-matrix. Quantitative electron spectroscopic imaging (ESI) shows an atomic ratio of the elements B:C:N of 1.0:4.0:1.1 in this matrix. In the vicinity of the cracks, silicon nitride locally decomposes with formation of silicon carbide because of its reaction with excess carbon. A detailed EFTEM study of the phase distribution near the crack surfaces showed that the first Si3N4 crystallites occur at a distance of approx. 5 μm from the carbon covered crack surface. In additional experiments the composition of the BNC-layers as a function of the distance from the crack surface was investigated.
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Research context
OpenAlex topics: Advanced ceramic materials synthesis · MXene and MAX Phase Materials · Advanced materials and composites
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References (24)
Show source-provided references
1. Synthesis of dense silicon-based ceramics at low temperatures10.1038/355714a0 ↗
2. Bill · Adv. Mater. · 1995 · 7 · 77510.1002/adma.19950070903 ↗
3. Niihara · J. Ceram. Soc. Jpn. · 1991 · 99 · 97410.2109/jcersj.99.974 ↗
4. Riedel · J. Am. Ceram. Soc. · 1998 · 81 · 334110.1111/j.1151-2916.1998.tb02780.x ↗
5. Jansen, M. and Baldus, H.-P. Ger. Offen. DE 410 71 08 A1, 1992.10.1002/chin.199232192 ↗
6. Baldus · Mater. Res. Soc. Symp. Proc. · 1992 · 271 · 82110.1557/PROC-271-821 ↗
7. Riedel, R., Kienzle, A., Petzow, G., Brück, M. and Vaahs, T. Ger. Offen. DE 432 07 83 A1, 1994.
8. Bill, J., Kienzle, A., Sasaki, M., Riedel, R. and Aldinger, F. In Ceramics: Charting the Future, ed. P. Vincenzini. Techna Sri, 1995.
9. Riedel · Nature · 1996 · 382 · 79610.1038/382796a0 ↗
10. Boron containing non-oxide ceramics from organometallic polymers
11. Baldus, H.-P. and Jansen, K., Moderne Hochleistungskeramiken—amorphe anorganische Netzwerke aus molekularen Vorläufern. Angew. Chem. 109, 1997, 338–354 (Angew. Chem. Int. Ed. Engl. 36, 1997, 328).10.1002/anie.199703281 ↗
12. Synthesis and thermal behavior of novel Si–B–C–N ceramic precursors10.1021/cm9910299 ↗
13. Seifert · Ber. Bunsenges. Physikal. Chemie · 1998 · 102 · 130910.1002/bbpc.19981020942 ↗
14. Seifert, H.-J. and Aldinger, F. In Precursor-Derived Ceramics, ed. J. Bill, F. Wakai and F. Aldinger. Wiley VCH, 1999, p. S.165.10.1002/9783527613823.ch4 ↗
15. Interface characterization of nanosized B-doped Si3N4/SiC ceramics10.1016/1359-835X(96)00004-8 ↗
16. Reimer · Ultramicroscopy · 1988 · 24 · 33910.1016/0304-3991(88)90126-X ↗
17. Polymer-derived Si-based bulk ceramics, part II: microstructural characterisation by electron spectroscopic imaging10.1016/0955-2219(95)00029-T ↗
18. Quantitative analysis of electron spectroscopic imaging series10.1016/S0968-4328(97)00037-1 ↗
19. Quantitative thin film analysis by energy filtering transmission electron microscopy10.1016/S0304-3991(99)00021-2 ↗
20. Strecker · Pract. Metallography · 1993 · 30 · 48210.1515/pm-1993-301002 ↗
21. Optimization of TEM specimen preparation by double sided ion beam thinning under low angles10.1093/oxfordjournals.jmicro.a023673 ↗
22. D'Ans, Lax, Taschenbuch für Chemiker und Physiker, 4. Auflage, Springer Verlag, Band 3, 1998.10.1007/978-3-642-58842-6 ↗
23. Baumgart · 1994
24. Stable BC2N nanostructures10.1016/S0009-2614(99)00845-3 ↗