Some Effects of “Trichloroethylene Oxidation” on the Characteristics of MOS Devices
Source abstract
Abstract
Abstract not Available.
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and devices · GaN-based semiconductor devices and materials · Water Quality Monitoring and Analysis
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Affiliations
Stanford Integrated Circuits Laboratory, Stanford, California 94305
References
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