The Analysis of Anodic Oxide Films on GaAs and GaP by Means of Radioactive Tracer Techniques
Source abstract
Abstract
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis
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Affiliations
Philips Research Laboratories, Eindhoven, The Netherlands
References
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