Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO2(110) (1 * 1)
Source abstract
Abstract
The bonding features and three dimensional structures of metal clusters on single crystal oxide surfaces can be determined by the polarization dependent total reflection fluorescence XAFS (PTRF-XAFS) method. K-edge XAFS has a cos2 θ polarization-dependence to give successfully three dimensional structure while L3 edge XAFS has a weaker polarization dependence though the L3 edge is suitable for Au and Pt samples. In order to overcome this issue, we have developed an angle-resolved total reflection fluorescence XAFS (ARTRF-XAFS) method to determine more precise three dimensional structures of Au clusters using the L3 edge by increase the number of data points. In this paper we described the methodologies of the ARTRF-XAFS and the results of Au clusters on the TiO2(110) surface.
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Research context
OpenAlex topics: Catalytic Processes in Materials Science · Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Material Science, International Christian University
Catalysis Research Center, Hokkaido University
Photon Factory, Institute of Structural Material Science
References (14)
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