Lattice and Grain‐Boundary Diffusion of Al in Tetragonal Yttria‐Stabilized Zirconia Polycrystalline Ceramics (3 Y‐TZP ) Analyzed Using SIMS
Source abstract
Abstract
Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3 Y‐TZP ). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by secondary ion mass spectroscopy. The experimental results for the lattice diffusion (D B ) and grain boundary diffusion (D GB ) are as follows: urn:x-wiley:00027820:media:jace13126:jace13126-math-0001 and urn:x-wiley:00027820:media:jace13126:jace13126-math-0002 where δ is the grain‐boundary width and s is the segregation factor.
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Research context
OpenAlex topics: Advanced ceramic materials synthesis · Nuclear materials and radiation effects · Advanced materials and composites
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Faculty of Metals Engineering and Industrial Computer Science AGH University of Science and Technology Krakow Poland
Faculty of Materials Science and Ceramics AGH University of Science and Technology Krakow Poland
Faculty of Computer Science, Electronics and Telecommunications AGH University of Science and Technology Krakow Poland
Funding
Polish National Center of the Science
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