Determining Young's modulus of conductive thin films by a thermal bend beam test
Source abstract
Abstract
An experimental method used to measure the Young's modulus of the conductive thin film is proposed in this paper. This technology has utilized the electrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. The Young's modulus of conductive SnO 2 thin film has been estimated by means of the formula and the thermal bend beam test presented.
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Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · Advanced Sensor Technologies Research · Surface Roughness and Optical Measurements
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Affiliations
Huazhong University of Science and Technology Department of Mechanics Wuhan, People's Republic of China
The Hong Kong Polytechnic University Department of Manufacturing Engineering Hong Kong
Wuhan University of Hydraulic and Electric Engineering Structure Mechanics Research Group Wuhan, People's Republic of China
References (20)
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