Evaluating the Topological Surface Properties of Cu/Cr Thin Films Using 3D Atomic Force Microscopy Topographical Maps
Source abstract
Abstract
In the present work, Cu/Cr thin films were deposited on substrates of a different nature (Si, Glass, Bk7, and ITO) through a thermal evaporation deposition method. Non-contact atomic force microscopy (AFM) was used to obtain 3D AFM topographical maps of the surface for the Cu/Cr samples. Various analyses were carried out to obtain crucial parameters for the characterization of the surface features. In particular, Minkowski functionals (including the normalized Minkowski volume, the Minkowski boundary, and the Minkowski connectivity) and studies of the spatial microtexture by fractal and multifractal analyses were carried out. Different roughness parameters (including arithmetical mean height, root mean square height, skewness, kurtosis, fractal dimension, Hurst coefficient, topographical entropy, and fractal lacunarity) were quantified in these analyses for the comparison of the surface morphology of the different samples. All the samples displayed non-Gaussian randomly rough surfaces, indicating the presence of multifractal features.
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Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Adhesion, Friction, and Surface Interactions · Theoretical and Computational Physics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Mälardalens Högskola (EST), Mälardalen University, 722 20 Vasteras, Sweden
Department of Basic Sciences, Birjand University of Technology, Birjand 9719866981, Iran
Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah 6718773654, Iran
Facultad de Ciencias Físico Matemáticas (FCFM), Universidad Autónoma de Nuevo León (UANL), Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico
Postgraduate Program in Materials Science and Engineering, Federal University of Sergipe, São Cristovão 49100-000, SE, Brazil
Department of Physics, Federal University of Ceará—UFC, Fortaleza 60180-020, CE, Brazil
Department of Physics, Federal University of Sergipe, São Cristovão 49100-000, SE, Brazil
Laboratory of Synthesis of Nanomaterials and Nanoscopy, Physics Department, Federal University of Amazonas-UFAM, Manaus 69067-005, AM, Brazil
The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, 15 Constantin Daicoviciu St., 400020 Cluj-Napoca, Romania
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