On the Thermally Induced Interfacial Behavior of Thin Two-Dimensional Hexagonal Quasicrystal Films with an Adhesive Layer
Source abstract
Abstract
The mechanical response of a quasicrystal thin film is strongly affected by an adhesive layer along the interface. In this paper, a theoretical model is proposed to study a thin two-dimensional hexagonal quasicrystal film attached to a half-plane substrate with an adhesive layer, which undergoes a thermally induced deformation. A perfect non-slipping contact condition is assumed at the interface by adopting the membrane assumption. An analytical solution to the problem is obtained by constructing governing integral–differential equations for both single and multiple films in terms of interfacial shear stresses that are reduced to a linear algebraic system via the series expansion of Chebyshev polynomials. The solution is compared to that without adhesive layers, and the effects of the aspect ratio of films, material mismatch, and the adhesive layer, as well as the interaction between films, are discussed in detail. It is found that the adhesive layer can soften the localized stress concentration. This study is instructive to the accurate safety assessment and functional design of a quasicrystal film system.
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Research context
OpenAlex topics: Quasicrystal Structures and Properties · Solidification and crystal growth phenomena · Liquid Crystal Research Advancements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Mechanics and Safety Engineering, Zhengzhou University, Zhengzhou 450001, China
School of Civil and Mechanical Engineering, Curtin University, Perth, WA 6845, Australia
School of Mechanical and Power Engineering, Zhengzhou University, Zhengzhou 450001, China
Funding
National Natural Science Foundation of China · China Postdoctoral Science Foundation
References (44)
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