Study of Mask Electrochemical Machining for Ring Narrow Groove under the Action of Multiple Physical Fields
Source abstract
Abstract
Deep and narrow groove structures are widely used in aviation, aerospace, weapons, and other industries, and play a very important role. In order to solve the problems of machining tool deformation, machining flying edge, burr in traditional Computerized Numerical Control (CNC) milling for deep and narrow grooves, and the problems of serious motor loss and low machining efficiency in non-contact electrical discharge machining (EDM), electrochemical mask machining through the mask treatment of the non-processed part mask processing, and with no loss of the processing cathode tool, was suggested as an efficient way to solve these problems. Considering that the corrosion removal of the anodic workpiece is mainly subject to the multi-physical field coupling action between the electric field, the flow field, and the temperature field, it is necessary to construct a multi-physical field coupling model of electrochemical mask machining and combine this with the numerical simulation analysis to realize the distribution state of the multi-physical field, so as to realize the optimization guidance of the overall processing process.
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Research context
OpenAlex topics: Advanced Machining and Optimization Techniques · Advanced machining processes and optimization · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Science and Technology, Xi’an Technological University, Xi’an 710021, China
School of Mechatronic Engineering, Xi’an Technological University, Xi’an 710021, China
School of Computer Science and Engineering, Xi’an Technological University, Xi’an 710021, China
School of Mechatronic Engineering, Northwestern Polytechnical University, Xi’an 710124, China
Ministry of Technology, Xi’an KunLun Industry (Group) Company with Limited Liability, Xi’an 710021, China
Funding
2019 Yulin Science and Technology Program
References (35)
Show source-provided references
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