The Contamination Audit – A Vital Tool For Yield Improvement
Source abstract
Abstract
With the increasing trends towards fineline circuitry,contamination has become a major cause of defects. This paper outlines the techniques used in conducting a Contamination Audit and in generating a Contamination Matrix, which is a map of the types of contamination and their relative levels within a facility. Using the Contamination Matrix contamination control measures can be targetted in the most effective manner to achieve yield improvements.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing
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Affiliations
Teknek Electronics Ltd, Bridge of Weir, Renfrewshire, Scotland
References
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