journal article·1996-04-01

The Contamination Audit – A Vital Tool For Yield Improvement

S. Hamilton

Circuit World· Volume 22· Issue 1
Publisher page

Abstract

With the increasing trends towards fineline circuitry,contamination has become a major cause of defects. This paper outlines the techniques used in conducting a Contamination Audit and in generating a Contamination Matrix, which is a map of the types of contamination and their relative levels within a facility. Using the Contamination Matrix contamination control measures can be targetted in the most effective manner to achieve yield improvements.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Teknek Electronics Ltd, Bridge of Weir, Renfrewshire, Scotland

References

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