In Search of the Ultimate Test Strategy
Source abstract
Abstract
In an attempt to illustrate the variety of test methods available to the modern electronic manufacturer, the paper describes the major alternatives and offers a method of matching alternative strategies to the particular test problems being faced. Test efficiency is described as a means of comparing alternative test strategies and choosing that which ‘fits best’. One form of test, In‐Circuit test, is examined in more detail and guidelines for improving test coverage are described.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: VLSI and Analog Circuit Testing · Engineering and Test Systems · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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