article·1996-12-01

The Contamination Audit ‐ A Vital Tool For Yield Improvement

Sharon J. Hamilton

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Abstract

With the increasing trends towards fineline circuitry, contamination has become a major cause of defects. This paper outlines the techniques used in conducting a Contamination Audit and in generating a Contamination Matrix, which is a map of the types of contamination and their relative levels within a facility. Using the Contamination Matrix contamination control measures can be targetted in the most effective manner to achieve yield improvements.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing

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