New Methods of Surface Area Measurement and Current Density Control in PCB Manufacture
Source abstract
Abstract
New methods of surface area measurement by electrolytic means have been introduced into the UK by PMD Chemicals Ltd of Coventry. Two instruments, known as the DIM and MIM systems respectively, are available. The instruments differ in their method of measurement and applications, but both measure the conductive surface area of photo‐resisted boards to a high degree of accuracy and can convert this area measurement via an interface unit to a rectifier current output, thereby controlling plating current density.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Sensor Technology and Measurement Systems · Industrial Vision Systems and Defect Detection
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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