article·1991-03-01

PWB Interconnect Strategy Using a Full Build Electroless Copper Plating System

K. Minten, James R. Toth

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Abstract

Two current full build electroless copper deposits were investigated. This paper demonstrates that there are fundamental differences in the nature of their deposits. The consequences of these differences are highlighted for the PWB manufacturer.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electrodeposition and Electroless Coatings · Copper Interconnects and Reliability · Semiconductor materials and devices

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References

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